Contract

Field-Emission Scanning Electron Microscope (FE-SEM) with Electron Backscatter Diffraction (EBSD) and Energy Dispersive Spectroscopy (EDS) Detectors and Analytical Software.

Agency: COMMERCE, DEPARTMENT OF / NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY
Location: Gaithersburg, MD
Amount: Amount not listed
Deadline: Closes in 13 days (Jul 31, 2026)
Posted: Jul 17, 2026
Set-aside: None (open competition)
NAICS code: 334516

What this contract is for

This is a sources sought notice. The purpose of this notice is to conduct market research and identify potential sources of commercial products/services that satisfy the Government’s anticipated needs. NIST is seeking responses from all responsible sources, including large and small businesses. The North American Industry Classification System (NAICS) code for this acquisition is 334516 – Analytical Laboratory Instrument Manufacturing, with a Small Business Size Standard of 1000 employees. This notice does not constitute a Request for Proposal (RFP), Request for Quotation (RFQ), Invitation for Bids (IFB), or any commitment by the Government to issue a solicitation or award a contract. The National Institute of Standards and Technology (NIST) will not pay for any information submitted in response to this notice. Submission of information is voluntary and will not result in any obligation on the part of the Government. NO SOLICITATION DOCUMENTS EXIST AT THIS TIME Requests for solicitation documents will not receive a response. Respondents shall clearly mark any proprietary or restricted information. In the absence of such markings, NIST will assume unlimited rights to all technical data submitted. BACKGROUND Several mission-critical research projects such as Creating Helpful Incentives to Produce Semiconductors (CHIPS) program, Additive Manufacturing Benchmark Test Series (AM-Bench), Computational Materials for Qualification and Certification (CM4QC), and the NIST Center for Automotive Lightweighting (NCAL), rely on Field-Emission Scanning Electron Microscope (FE-SEM) measurements with Energy Dispersive Spectroscopy (EDS) and Electron Backscatter Diffraction (EBSD) for mission-critical tasks and deliverables. Current instrumentation is insufficient to meet current and pro...

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